DRAM Td110 GIGA-TORQ™ probecards for DRAM applications use a specially designed probe and an exceptionally high performance proprietary interposer capable of meeting challenging DRAM applications. Td160 GIGA-TORQ™ probecards for DRAM are capable of testing 300mm DRAM wafers in just four touchdowns thus improving test floor throughput. Our single touchdown technology will enable future high speed, one touchdown, FPC DRAM testing as tester technology advances.