Flash The ACCU-TORQ™ torsional probe stores spring energy far more efficiently than competing cantilever style MEMS probes. ACCU-TORQ™ technology allows our probecards to test NOR flash die as small as 4mm. Td110 ACCU-TORQ™ is suited for the high pin count, small die of NOR. Td160 ACCU-TORQ™ probecards are well suited to testing FPC (full pin count) NAND wafers. Touchdown Technologies' 1Td200 and 1Td300 product lines, which are currently under development will be the most reliable and scalable full wafer probecards on the market. They will be used to test LPC NOR and FPC NAND wafers in just one touchdown.